Cantilever, electrical conductive,10 pcs, for conductive AFM

Cantilever electrical measurement modes of the atomic force microscope (09700-99) for electrical modes (EFM, Spreading resistance, Force modulation) Material: Si, monolithic Coating on both sides: electrical conductive (Pt/Cr) Holder chip: 3.4 x 1.6 x 0.3 mm, with alignment grooves Tip radius: less than 25nm Resonance Frequency: 75 kHz Spring constant: 3 N/m Length: 0.225mm Width: 0.028mm 10 pcs Weight: 0.04 kg