Compact AFM, Atomic Force Microscope

Compact and easy-to-use atomic force microscope for imaging a wide range of micro- and nanostructures. Designed for teaching, laboratory courses, and research preparation in physics, chemistry, life sciences, and engineering. Compact all-in-one device, easy to operate and transport Complete solution including instrument, samples, probes, tools, and experiment descriptions Automatic probe approach to prevent damage to probe and sample Samples are easy to insert and replace No laser alignment required Research-grade system at about one third of the cost of a research instrument Technical Specification Measurement modes: contact, dynamic, phase contrast, MFM, EFM, basic spectroscopy (force–distance, amplitude–distance, voltage–distance) Scan head with integrated control on vibration-damped base plate, 21 × 21 × 18 cm (L × W × H) Folding mechanism for sample and cantilever access with automatic switch-off of sample illumination and automatic retraction of the scan head; transparent protection against airflow and sound; USB 2.0 interface Tip-scanner AFM: linear, electromagnetic, low voltage Maximum scan area: 70 × 70 µm² (XY dimension, 10% manufacturing tolerance) Maximum Z range: 14 µm Resolution X/Y/Z: 1.1 nm Z noise level (RMS static mode): 0.6 nm Z noise level (RMS dynamic mode): 0.5 nm Automatic approach: vertical, up to 4.5 mm Holder for standard cantilevers from various manufacturers with alignment grooves Top-view camera: USB, 2048 × 1536 pixels, resolution better than 2 µm, digital zoom 1×, 2×, 4× White LED sample illumination with automatic switch-off Expandable to additional modes via optional upgrade packages Extended instrument control via scripting/user interface access (LabView, VisualBasic, …) Cantilever set: 4× contact mode, 4× dynamic mode Sample set (6): carbon nanotubes, CD stamp, chip structure, skin cross-section, microstructure, dried Staphylococcus bacteria Four empty sample holders for user samples Tool set for mounting samples and cantilevers Powerful software for measurement, analysis, and visualization (1D, 2D, 3D) Manual with detailed operating and software instructions and five fully described experiments Power supply: 100–240 V, 50/60 Hz Plastic case with compartments for upgrade packages and side camera, 44 × 32 × 25 cm