Qualitative X-ray fluorescence spectroscopy of metals - Moseley's law
Article No: P2544505
Various metal samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multi channel analyser. The energy of the corresponding characteristic X-ray lines is determined and the resulting Moseley diagram is used to determine the Rydberg frequency and the screening constants. Experience the essence of the Nobel Prize: Röntgen (1901) X-ray fluorescence analysis (XRF) of different alloys Other alloys are also possible X-ray energy detector (XRED) with multichannel analyzer (MCA) guarantess high counting rates without warm-up time Calibrate the semiconductor energy detector with the aid of the characteristic radiation of the tungsten X-ray tube. Record the spectra of the fluorescence radiation that are generated by the metal samples. Determine the energy values of the corresponding characteristic K α- and K β-lines. Determine the Rydberg frequency and screening constants with the aid of the resulting Moseley diagrams. Bremsstrahlung characteristic X-radiation Absorption of X-rays Bohr's atom model Energy levels Moseley's law Rydberg frequency Screening constant Semiconductor energy detectors Multichannel analysers