X-ray investigation of crystal structures / Laue method with digital X-ray image sensor(XRIS)
Article No: P2541606
Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic diffraction pattern results. This pattern is photographed with the digital X-ray sensor XRIS. The Laue diffraction of an LiF monocrystal is to be recorded with the aid of the digital X-ray sensor. The Miller indices of the corresponding crystal surfaces are to be assigned to the Laue reflections. Crystal lattices Crystal systems Crystal classes Bravais lattice Reciprocal lattice Miller indices Structure amplitude Atomic form factor The Bragg equation Software included. Computer not provided.