American Scientific, LLC · Columbus, Ohio · Exclusive U.S. Distributor of PHYWE Systems
American Scientific, LLC · Columbus, Ohio · Exclusive U.S. Distributor of PHYWE Systems
Cantilever electrical measurement modes of the atomic force microscope (09700-99) Equipment and Technical Data for electrical modes (EFM, Spreading resistance, Force modulation) Material: Si, monolithic Coating on both sides: electrical conductive (Pt/Cr) Holder chip: 3.4 x 1.6 x 0.3 mm, with alignment grooves Tip radius: less than 25nm Resonance Frequency: 75 kHz Spring constant: 3 N/m Length: 0.225mm Width: 0.028mm 10 pcs Weight: 0.04 kg
| Material | Si, monolithic |
| Coating on both sides | electrical conductive (Pt/Cr) |
| Holder chip | 3.4 x 1.6 x 0.3 mm, with alignment grooves |
| Tip radius | less than 25nm |
| Resonance Frequency | 75 kHz |
| Spring constant | 3 N/m |
| Length | 0.225mm |
| Width | 0.028mm |
| Weight | 0.04 kg |
All units adapted for 110V/60Hz. Contact us for volume pricing and grant assistance.
