Cantilever for Magnetic Force Microscopy with the AFM (09700-99). Equipment and Technical Data for Magnetic Force Microscopy Material: Si, monolithic Reflex coating: Aluminium Coating at sample side: magnetic (Pt/Cr) Chip holder: 3.4 x 1.6 x 0.3 mm, with alignment grooves Resonance frequency: 75 kHz Spring constant: 3 N/m Length: 0.225mm Width: 0.038mm Tip radius: less than 60nm 10 pcs Weight: 0.04 kg
| Material | Si, monolithic |
| Reflex coating | Aluminium |
| Coating at sample side | magnetic (Pt/Cr) |
| Chip holder | 3.4 x 1.6 x 0.3 mm, with alignment grooves |
| Resonance frequency | 75 kHz |
| Spring constant | 3 N/m |
| Length | 0.225mm |
| Width | 0.038mm |
| Tip radius | less than 60nm |
| Weight | 0.04 kg |
All units adapted for 110V/60Hz. Contact us for volume pricing and grant assistance.