American Scientific, LLC · Columbus, Ohio · Exclusive U.S. Distributor of PHYWE Systems
American Scientific, LLC · Columbus, Ohio · Exclusive U.S. Distributor of PHYWE Systems
Compact and easy-to-use atomic force microscope for imaging a wide range of micro- and nanostructures. Designed for teaching, laboratory courses, and research preparation in physics, chemistry, life sciences, and engineering.
| Measurement modes | contact, dynamic, phase contrast, MFM, EFM, basic spectroscopy (force-distance, amplitude-distance, voltage-distance) |
| Tip-scanner AFM | linear, electromagnetic, low voltage |
| Maximum scan area | 70 × 70 µm² (XY dimension, 10% manufacturing tolerance) |
| Maximum Z range | 14 µm |
| Resolution X/Y/Z | 1.1 nm |
| Z noise level (RMS static mode) | 0.6 nm |
| Z noise level (RMS dynamic mode) | 0.5 nm |
| Automatic approach | vertical, up to 4.5 mm |
| Top-view camera | USB, 2048 × 1536 pixels, resolution better than 2 µm, digital zoom 1×, 2×, 4× |
| Cantilever set | 4× contact mode, 4× dynamic mode |
| Sample set (6) | carbon nanotubes, CD stamp, chip structure, skin cross-section, microstructure, dried Staphylococcus bacteria |
| Power supply | 100-240 V, 50/60 Hz |
All units adapted for 110V/60Hz. Contact us for volume pricing and grant assistance.
